Here you find current news about products and other important information about the company FEINMETALL. If you want to keep up to date on a regular basis, you can also sign in for our NEWSLETTER, which is published approximately three to four times per year.
Today's wire harnesses have to be suitable for high data transmission rates, and that with minimal space requirements in terms of connection technology. The new connectors HFM® or MATE-AX® meet these requirements perfectly. Feinmetall now offers a tailor-made contacting solution for these connectors.
Feinmetall's vertical probe card technology is one of the leading contacting solutions in wafer testing. With the introduction of the next ViProbe® generation, ViProbe®II (long lifetime), the existing advantages are supplemented by additional mechanisms for life extending and protecting the wafer.
We are very pleased about the great interest, many good discussions, new projects and the overall positive feedback at productronica in Munich! Many thanks to everyone who visited our booth. With a few impressions and an interview with the magazine EPP you will get a small glimpse of our booth.
Contacting PCBs places high demands on contact technology, especially for contaminated, oxidized or OSP-coated PCBs and lead-free solders. With the approved PROGRESSIVE Series, successfully used by many customers, Feinmetall has solved contact problems in most difficult conditions.
Wolfgang Bürkle retires at the age of 70 and after more than 20 years as managing director from the operative business at Feinmetall. He will be succeeded by Dr. Peter Geiselhart, who already became familiar with Feinmetall as technical director in the mid-1990s.
The current developments in electromobility and the rapidly growing field of battery production require completely new contact solutions. Feinmetall continues to set standards with new solutions. The contact block HC01 allows applications with up to 600 A continuous current.
The use of RF components in electrical and electronic devices is currently increasing rapidly. Suitable contacting systems are therefore required for test purposes. Feinmetall has set up a competence center with its own RF laboratory for these applications and expanded the portfolio of RF contact probes and accessories according to the customers’ needs.
FEINMETALL now offers a special contacting solution for the very special high speed Fakra connectors MateAX and HFM. The coaxial probes of the F835 series allow a secure and reliable contacting for the electrical test of these connectors.
The contacting of very small connectors with diameters down to 50 mil is not trivial, especially since the terminals require special mechanical measures for contacting due to their special internal structure. Depending on the required functionality and available space, there are different approaches to solutions.
OSP (= Organic Surface Protection) is a protective layer on printed circuit boards that is transparent and hardly visible on the copper. This protective layer is considerably harder than conventional surface finishes, oxide layers or impurities and therefore difficult to penetrate.
When Feinmetall founded its subsidiary in Mexico in 2008, the financial markets were in turmoil and the outcome of the company was uncertain. The balance after ten years is clear: By 2017 Feinmetall Mexico multiplied its sales to more than 3 million USD.
From June 3rd to June 6th FEINMETALL was attending the Semiconductor Wafer Test Workshop (SWTW) in San Diego again - with impressive results! Two Feinmetall presentations have been awarded. Additionally the new probe card lines FeinProbe® and MµProbe® have been shown.
Feinmetall has invested in a new production hall at its Herrenberg site. At the beginning of 2018, all work steps related to the mechanical processing of metal are accommodated in the new building. This creates space in the main building for further automation. In total, Feinmetall has invested around two million euros in the new production facilities in Herrenberg.
The newly developed LED contact probe allows a cost saving module design. By an integrated LED within the contact probe the operator is guided through the terminal insertion process. The same module and the same contact probes can be used for the following electrical continuity check.
For the reliable contacting of contaminated areas or critical surfaces like aluminum or nickel FEINMETALL has developed a new contact probe 1860C009 . By using three inclined contact probes, lateral scrubs on the contacted surface are realized. This significantly reduces the contact resistance compared to standard high current probes.
In the new FEINMETALL FeinProbe® very fine spring contact probes are used as contact elements instead of buckling beams. This technology is ideal for contacting fine centers in bump applications.
Suitable holding devices allow a simple and secure mounting of all FEINMETALL test connectors. The floating design of the holding devices leads a certain flexibility regarding the position of the DUT. So even if the DUT has a certain offset or is slightly twisted, still a long-life contacting can be realized.
A new design of the existing contact probe series F650 and the introduction of the new series F652 now leads to a higher contact reliability. The new bias design makes sure that during compression the plunger is always slightly inclined and so it is ideally pushed to the barrel.
PCB structures are becoming smaller and smaller and require corresponding test equipment with very small centers. That's why FEINMETALL has developed new contact probes for 30 mil centers as completion to the already introduced probes for 40 and 50 mil.
On Saturday, June 24th a famous local run called "Altstadtlauf" took place in the historic center of Herrenberg, Germany. For the first time a team from FEINMETALL participated in uniform shirts.
Our new probe series HF66 has been developed for reliable contacting of SMD-soldered RF mini connectors like for example switch connectors or coaxial cable connectors. The special RF probe design makes sure that probe and DUT are well aligned in a large centering range.
A position sensor system is the ideal solution for exact measurement and documentation of pin lengths, hole depths etc. This system can be used like a contact probe even in small centers. An integrated potentiometer allows the exact determination of the position of the DUT.
With contact elements and fixtures for the Li-ion cell production and for battery manufacturing FEINMETALL has gained a strong expertise during the last years. For formation of accumulator cells we have developed special coaxial high current Kelvin probes.
With our new tool poster we provide you a quick overview about our tools for mounting contact probes. For a first impression you can have a look at the pdf version. On request, we will provide you a printed version by mail!
FEINMETALL has invested about six million Euro in the production and development facilities in Herrenberg, Germany. New cleanrooms and production machines, test equipment and special instruments are leading to higher capacities, lower error rates and shorter lead times.
The market needs for contacting semiconductor components are rapidly increasing. Components are smaller and smaller and the signal frequencies of the test signals are getting higher and higher. FEINMETALL reacts on these developments with new fine pitch probes.
Due to the increasing globalization of the markets FEINMETALL also grows more and more in terms of inernational business. This corresponds to a considerably increasing FEINMETALL presence at international exhibitions.
The coaxial RF-probes of the probe family HF860 are already available for a large variety of standard connectors like SMA, SMB, SMC, U.Fl. or RF. Now the HF860 is also available for contacting FAKRA-connectors and for contacting directly on PCBs.
The need of contacting standard USB, RJ or HDMI connections and interfaces is increasing, not only in the field of in-circuit and functional test of PCBs but also in testing wire harness. The new FEINMETALL test contacts are currently available for various USB,RJ and HDMI-Interfaces. They can be mounted into test fixtures or modules easily and effectively.
The Pneumatic Micro Switch Probe has been developed for position test applications with limited space. The correct position of a test item can be detected by the pneumatic ascending of the plunger in combination with the integrated double switch function.