In the new FEINMETALL FeinProbe® spring contact probes are used as contact elements instead of buckling beams. This technology is ideal for contacting fine pitches in bump applications, especially for:
Using spring contact probes has several advantages for contacting chips, because they are independently spring loaded and have a special tip style for creating optimized electrical contacts to the DUT.
The advantages at a glance
Specifications
Contact elements | X01, X02, X03 | ||
Pitch | min 350 µm | ||
Contact probe count | up to 5 000 | ||
Active area | up to 60 mm x 60 mm | ||
Temperature range | -40°C to +150°C | ||