In the new FEINMETALL FeinProbe® spring contact probes are used as contact elements instead of buckling beams. This technology is ideal for contacting fine pitches in bump applications, especially for:
Using spring contact probes has several advantages for contacting chips, because they are independently spring loaded and have a special tip style for creating optimized electrical contacts to the DUT.
The advantages at a glance
|Contact elements||X01, X02, X03|
|Pitch||min 350 µm|
|Contact probe count||up to 5 000|
|Active area||up to 60 mm x 60 mm|
|Temperature range||-40°C to +150°C|