From June 3rd to June 6th FEINMETALL was attending the Semiconductor Wafer Test Workshop (SWTW) in San Diego again - with impressive results!
At this workshop the worldwide semiconductor wafer test experts meet and discuss the trends and new developments in the field of wafer contacting. FEINMETALL is represented as "Silver Sponsor".
Besides presentations about the analysis of pad cracks and about a new measuring method for determining the current carrying capability of probe cards, the new probe card lines FeinProbe® and MµProbe® have been shown.
The presentation by Gunther Boehm and Jory Twitchell (NXP Chandler) "A Real-Life Pad Crack Study" received the award for "Best Data Presentation". more
The presentation "A Novel Measurement Method for Measuring CCC and MAC At Once" by Dr. Schnaithmann received the award for "Best Presentation Tutorial in Nature". more
The awards were handed over by Jerry Broz, Chairman of SWTW.
All presentations of the workshop can be found directly on the corresponding page of the event (link below), the award-winning presentations can be found at "Awarded Presentations".