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Contact probes for high currents
Contact probes for wire harness test
Contact probes for connector test
Radio frequency probes
Wafer probe card FeinProbe ®
Test head for contacting sensors

The future of contacting technology for tomorrow’s cars

From wire harness and battery testing to RF component and semiconductor chip testing, Feinmetall has the perfect contacting solution.

Currently, the automotive technology is developing rapidly. Feinmetall offers comprehensive contacting solutions for the entire field of electric mobility. The strength in classic wire harness tests also continues in battery testing and in contacting RF connectors. And it even extends to contacting semiconductor chips.

High-current contacts for electric mobility

Battery technology is the basis for electric mobility. Research centers and production facilities for battery cells are currently being built and expanded on a large scale, and the demands on batteries are increasing rapidly. This is why high-performance contacts are gaining in importance. Innovation is needed to contact battery cells reliably. Contacting solutions are needed here that can transmit high currents on the one hand, but are also equipped with sense pins, temperature monitoring or cooling options. Feinmetall is a pioneer in this field; for years, our experts have been on board with manufacturers and have developed sophisticated solutions.

> find out more about contacting battery cells

But even charging devices as well as aggregates in the entire car must be reliably tested in production and also contacted. In this area, Feinmetall offers unique solutions that allow not only simple electrical tests, but also the verification of the contact protection at the same time. This allows testing of safety features in addition to functionality, and without additional effort.

> Video contacting of round pins

World market leader in contacts for wire harness test

For years, Feinmetall is the world market leader in equipping wire harness test benches with contacting technology. Constant innovations developed in close cooperation with customers, numerous patents and clever additional functions in customized contact probes confirm this leading role. Feinmetall offers advanced and mature solutions, whether for push-back or presence testing of connector elements, for testing correct wiring, for supporting wire assembly or for contacting high-frequency connectors such as HFM, FAKRA, H-MTD, MateAX, MateNET, etc.

> Poster contact solutions for wire harness test

Reliable contacts for RF technology and 5G

Due to the increase of driver assistance systems and new technologies for autonomous driving, RF technology and 5G are currently top issues in automotive applications. Feinmetall offers first-class contacting technology for reliable testing of the components and connectors used here, even with the highest RF performance requirements. RF-capable contacting units allow the transmission of signals up to 18 GHz. Here, too, the focus is on various automotive RF connectors such as HFM, FAKRA, H-MTD, MateAX, MateNET. Feinmetall's great strength lies primarily in the details. For example, the RF probes are available in various mounting options, such as flanged or screwed or plug-in versions. In addition, many of Feinmetall's RF contacts are self-centering and floating and can thus optimally compensate for tolerances to the DUT.

> Video automotive RF contacting solutions

In addition to the appropriate frequency suitability of the individual components, the frequency behavior and the reproducibility of the entire transmission line are also important for users in RF testing. For this reason, Feinmetall offers not only the individual contact probes, but complete contacting units and the appropriate accessories such as RF cables and tools.

> Overview RF contact probes

Finest contacts for semiconductor test

Everyone has become aware of the fact that modern automotive technology is strongly based on the use of specific semiconductor chips, at the latest due to current market developments. Feinmetall is also playing a leading role in the contacting of chips and wafers. Fine pitch probes in test sockets and probe cards for testing semiconductor wafers require not only the finest pitch dimensions, but also maximum frequency performance.

Feinmetall also covers these contacting tasks comprehensively and has decades of expert knowledge in the semiconductor world. This is the only way we are able to develop and manufacture probe cards for pitches down to 40µm and for frequencies up to 77 GHz.

The gradual transition between fine pitch probes and probe cards is particularly evident in the FeinProbe®, a probe card with fine contact probes as contact elements, which was specially developed for high frequencies. This is where the company's development and manufacturing expertise is especially beneficial.

> Overview probe cards

However, fine pitch probes can also be found in test sockets or in sensor test equipment. Here Feinmetall also offers special adaptations tailored exactly to customer requirements.

Conclusion

Feinmetall stands out above all for the wide range of contacting solutions offered. From the finest pitches in semiconductor testing to the highest currents in battery cell production, Feinmetall impresses on a broad basis with innovative products. So the future can come, Feinmetall is ready.