Applications

Hexagonal
(07,08)

For testing plated vias and
pads. The sharp edges
penetrate contamination
and oxide layers.

Spherical
(11,12)

For testing clean contact
surfaces, does not leave
marks or scratches.

Flat
(16,17)

Suitable for solder pads
and contact pins.

Triangular
(15,30,62)

For via holes and solder pads.
The sharp edges penetrate
flux residues and oxide layers.

Square lance
(33,38,43,47,53)

For via holes and solder pads.
The sharp edges penetrate
flux residues and oxide layers.

4-fold crown
(14,20,21,28,29,37)

For pad surfaces and
soldered pins. The sharp
edges penetrate flux
residues and oxide layers.

Crown
(09,35,40,41,42,47,53,60,63)

For wire wrap posts,
even if the contacts
are bent or twisted.

Crown with inner pin
(36,68)

Used for reliable contacting
of plated or filled vias.

Step probes
(06,11,12,16,89)

For position and presence
tests of connectors.

Slotted insulation cap
for position test (PT)
(06,17)

For detecting the correct
length and straightness
of flat pins.

Insulation cap (IK)
(05,06,17,41)

For detecting the
correct length and
straightness of pins.

Spade
(80,81,82,83,84,85,86,89)

For twist proof contacting
of connector elements.

Coaxial design

Tip styles of coaxial probes
are used for contacting
standard connectors or for
contacting PCB test points,
SMD mini coax and
switch connectors