F56314B250G180 (item number 1001332) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 14 (4-point crown stepped (self-cleaning)), F56314B250G180 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F56314B250G180 combines a pitch of 3 mm / 118 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 2.5 mm. F56314B250G180 operates with 180 cN spring force and 4.3 mm nominal travel. F56314B250G180 is rated for 6 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F56314B250G180 is made of beryllium copper and is gold-plated.
