F10006B150G200H (item number 1013692) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 06 (Serrated stepped), F10006B150G200H combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B150G200H combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.5 mm. F10006B150G200H operates with 200 cN spring force and 4.3 mm nominal travel. The electrical rating of F10006B150G200H combines 5 A continuous current with 100 mΩ typical contact resistance. The plunger in F10006B150G200H is made of beryllium copper and is gold-plated. The final H identifies the high-temperature version; F10006B150G200H is suitable for applications up to 200 °C.
