As a Basic Contact Probe, F10014B150G100 (item number 1017412) establishes a spring-loaded electrical connection to the test point. With tip style 14 (4-point crown stepped (self-cleaning)), F10014B150G100 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014B150G100 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.5 mm. F10014B150G100 operates with 100 cN spring force and 4.3 mm nominal travel. F10014B150G100 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10014B150G100 is made of beryllium copper and is gold-plated.
