The Fine Pitch Double Plunger Probe FP800D2901B050G025L057 (item number 1130428) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP800D2901B050G025L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP800D2901B050G025L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP800D2901B050G025L057 includes pitch 1 mm / 39 mil, spring force 25 cN, continuous current 3.5 A.
