F10015B170P150 (item number 1140869) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 15 (Triangular 45° stepped), F10015B170P150 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10015B170P150 combines a pitch of 2.54 mm / 100 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 1.7 mm. F10015B170P150 operates with 150 cN spring force and 4.3 mm nominal travel. F10015B170P150 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10015B170P150 is made of beryllium copper and uses Progressive Coating.
