The Basic Contact Probe F07507S120L280 (item number 1168144) is designed for repeated contacting of test points in electronic test fixtures. With tip style 07 (Hexagonal 90° stepped), F07507S120L280 combines ICT/FCT use with a geometry intended for plated vias and pads where sharp edges penetrate contamination and oxide layers. F07507S120L280 combines a pitch of 1.9 mm / 75 mil with tip style 07 (Hexagonal 90° stepped) and a tip diameter of 1.2 mm. For F07507S120L280, spring force is 280 cN at a nominal travel of 4.3 mm. The continuous-current rating of F07507S120L280 is 4 A.
