As a Basic Contact Probe, F10079B064G300 (item number 1168369) establishes a spring-loaded electrical connection to the test point. F10079B064G300 belongs to the basic probe range for ICT/FCT, where tip geometry, spring force and surface finish are matched to the target test point. The design combines a pitch of 2.54 mm / 100 mil with tip style 79 (6-point crown flattened) and a tip diameter of 0.64 mm. F10079B064G300 operates with 300 cN spring force and 4.3 mm nominal travel. F10079B064G300 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10079B064G300 is made of beryllium copper and is gold-plated.
