The Basic Contact Probe F05006B060G200 (item number 1169655) is designed for repeated contacting of test points in electronic test fixtures. With tip style 06 (Serrated stepped), F05006B060G200 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. The design combines a pitch of 1.27 mm / 50 mil with tip style 06 (Serrated stepped) and a tip diameter of 0.6 mm. For F05006B060G200, spring force is 200 cN at a nominal travel of 4.3 mm. The continuous-current rating of F05006B060G200 is 3 A.
