The Basic Contact Probe F56311B130G200 (item number 1169819) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), F56311B130G200 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. F56311B130G200 combines a pitch of 3 mm / 118 mil with tip style 11 (Spherical) and a tip diameter of 1.3 mm. For F56311B130G200, spring force is 200 cN at a nominal travel of 4.3 mm. F56311B130G200 is specified for 6 A continuous current.
