The Basic Contact Probe F07536S120L200 (item number 1170028) is designed for repeated contacting of test points in electronic test fixtures. With tip style 36 (6-point crown stepped, middle pin longer), F07536S120L200 combines ICT/FCT use with a geometry intended for plated or filled vias. F07536S120L200 combines a pitch of 1.9 mm / 75 mil with tip style 36 (6-point crown stepped, middle pin longer) and a tip diameter of 1.2 mm. F07536S120L200 operates with 200 cN spring force and 4.3 mm nominal travel. For F07536S120L200, the specified continuous current is 4 A.
