The Basic Contact Probe F10062B090G225 (item number 1172278) is designed for repeated contacting of test points in electronic test fixtures. With tip style 62 (Triangular 30°), F10062B090G225 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10062B090G225 combines a pitch of 2.54 mm / 100 mil with tip style 62 (Triangular 30°) and a tip diameter of 0.9 mm. F10062B090G225 operates with 225 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F10062B090G225 is 5 A.
