The Basic Contact Probe F10017B150G200IK04 (item number 1016969) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B150G200IK04 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B150G200IK04 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. F10017B150G200IK04 operates with 200 cN spring force and 4.3 mm nominal travel. The electrical rating of F10017B150G200IK04 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10017B150G200IK04 is made of beryllium copper and is gold-plated.
