Probe Cards

Probe Cards

FEINMETALL today has a leading position
in the technology of probe cards
for contacting semiconductors


ViProbe® Probe Cards

Adaptable to an enormous range of applications, the ViProbe® is a proven buckling beam technology for more than 25 years, valued above all for its uniquely easy reparability.

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ViProbe® II Probe Cards

New version of vertical contact technology with focus on increased service life and other advantages.

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LiProbe® Probe Cards

Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.

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FeinProbe® Probe Cards

Contacting WLCSP, SiP or flipchip wafers requires probe cards that can tolerate high currents while ensuring high signal integrity. The FeinProbe® addresses these applications perfectly.

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Expert Advice from Feinmetall: The basis for your success

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Expert Advice at FEINMETALL

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