F10014S150P100HP (item number 1159064) provides a Basic Contact Probe for defined electrical contact in ICT and Functional Test fixtures. With tip style 14 (4-point crown stepped (self-cleaning)), F10014S150P100HP combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014S150P100HP combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.5 mm. For F10014S150P100HP, spring force is 100 cN at a nominal travel of 4.3 mm. F10014S150P100HP is specified for 5 A continuous current. For demanding test points, F10014S150P100HP combines functional Progressive Coating with the higher preload of the HP spring, supporting reliable contact on OSP surfaces and areas affected by flux or contamination.
