The Fine Pitch Double Plunger Probe FP260D0301B014G025L072 (item number 1023003) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP260D0301B014G025L072 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP260D0301B014G025L072, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP260D0301B014G025L072 includes pitch 0.35 mm / 14 mil, spring force 25 cN, continuous current 1.5 A.
