The Fine Pitch Double Plunger Probe FP580D6565B030G060L059H (item number 1024449) is designed for precise contacting where installation space is limited. FP580D6565B030G060L059H is designed for densely spaced test points found in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D6565B030G060L059H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP580D6565B030G060L059H includes pitch 0.75 mm / 30 mil, spring force 60 cN, continuous current 3.5 A. In this H configuration, FP580D6565B030G060L059H is part of the high-temperature range and can be used in applications up to 200 °C.
