Technical data
| General | |
|---|---|
| Structure | Double Plunger Probe |
| Type/family | FP-D |
| Pitch (mm/mil) | 0,75 / 30 |
| Temperature | -45°C...+200°C |
| Additional definition | HS1 |
| Dimensions | |
|---|---|
| Total length (mm) | 5.9 |
| Protrusion height (mm) | 0.8 |
| Tip style diameter (mm) | 0.3 |
| Barrel diameter (mm) | 0.58 |
| Tip style diameter (mm) 2 | 0.3 |
| Materials and surfaces | |
|---|---|
| Tip style | 65 |
| Tip style 2 | 03 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | High-grade steel |
| Spring plating | Gold |
| Plunger material 2 | Beryllium copper |
| Plunger plating 2 | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 30 |
| Spring force (cN) | 60 |
| Nominal travel (mm) | 0.5 |
| Maximum travel (mm) | 0.6 |
| Pointing accuracy +/- (mm) | 0.09 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 3.5 |
| Typical contact resistance (mOhm) | 50 |
Graphics
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP580D6565B030G060L059H (item number 1024449) is designed for precise contacting where installation space is limited. FP580D6565B030G060L059H is designed for densely spaced test points found in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D6565B030G060L059H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP580D6565B030G060L059H includes pitch 0.75 mm / 30 mil, spring force 60 cN, continuous current 3.5 A. In this H configuration, FP580D6565B030G060L059H is part of the high-temperature range and can be used in applications up to 200 °C.