The Fine Pitch Double Plunger Probe FP580D2929B030G060L058NM (item number 1028445) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP580D2929B030G060L058NM at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D2929B030G060L058NM, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.8 mm / 31 mil, spring force 60 cN, continuous current 3.5 A.
