As a Basic Contact Probe, F77117B180G150 (item number 1043631) establishes a spring-loaded electrical connection to the test point. With tip style 17 (Flat stepped), F77117B180G150 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77117B180G150 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.8 mm. F77117B180G150 operates with 150 cN spring force and 3.5 mm nominal travel. The electrical rating of F77117B180G150 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F77117B180G150 is made of beryllium copper and is gold-plated.
