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F77117B180G150 Perspective 1 F77117B180G150 Perspective 2

Basic Contact Probes (100 mil) F77117B180G150

Item number 1043631

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F771
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 25.4
Protrusion height (mm) 12.7
Tip style diameter (mm) 1.8
Barrel diameter (mm) 1.37
Materials and surfaces
Tip style 17
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 50
Spring force (cN) 150
Nominal travel (mm) 3.5
Maximum travel (mm) 4.4
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 20

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F77117B180G150 Family designation F77117B180G150 Tip style 1

Beschreibung des Produkts

As a Basic Contact Probe, F77117B180G150 (item number 1043631) establishes a spring-loaded electrical connection to the test point. With tip style 17 (Flat stepped), F77117B180G150 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77117B180G150 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 1.8 mm. F77117B180G150 operates with 150 cN spring force and 3.5 mm nominal travel. The electrical rating of F77117B180G150 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F77117B180G150 is made of beryllium copper and is gold-plated.