The Fine Pitch Double Plunger Probe FP280D1101P013U025L054 (item number 1087982) is designed for precise contacting where installation space is limited. Tip style 11 (Spherical) targets FP280D1101P013U025L054 at clean, sensitive contact surfaces; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP280D1101P013U025L054, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP280D1101P013U025L054 includes pitch 0.35 mm / 14 mil, spring force 25 cN, continuous current 1.5 A.
