The Basic Contact Probe F77230B130G300 (item number 1146966) is a spring-loaded probe for temporary electrical contact with test points. With tip style 30 (Triangular 45°), F77230B130G300 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F77230B130G300 combines a pitch of 2.54 mm / 100 mil with tip style 30 (Triangular 45°) and a tip diameter of 1.3 mm. For F77230B130G300, spring force is 300 cN at a nominal travel of 4 mm. F77230B130G300 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77230B130G300 is made of beryllium copper and is gold-plated.
