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F77230B130G300 Perspective 1 F77230B130G300 Perspective 2

Basic Contact Probes (100 mil) F77230B130G300

Item number 1146966

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 32
Protrusion height (mm) 10
Tip style diameter (mm) 1.3
Barrel diameter (mm) 1.66
Collar diameter (mm) 2.04
Press ring diameter (mm) 2.04
Materials and surfaces
Tip style 30
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 60
Spring force (cN) 300
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

F77230B130G300 Family designation F77230B130G300 Tip style 1

Beschreibung des Produkts

The Basic Contact Probe F77230B130G300 (item number 1146966) is a spring-loaded probe for temporary electrical contact with test points. With tip style 30 (Triangular 45°), F77230B130G300 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F77230B130G300 combines a pitch of 2.54 mm / 100 mil with tip style 30 (Triangular 45°) and a tip diameter of 1.3 mm. For F77230B130G300, spring force is 300 cN at a nominal travel of 4 mm. F77230B130G300 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77230B130G300 is made of beryllium copper and is gold-plated.