The Basic Contact Probe F10028S106L060L (item number 1167844) is designed for repeated contacting of test points in electronic test fixtures. With tip style 28 (4-point crown stepped), F10028S106L060L combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10028S106L060L combines a pitch of 2.54 mm / 100 mil with tip style 28 (4-point crown stepped) and a tip diameter of 1.5 mm. For F10028S106L060L, spring force is 60 cN at a nominal travel of 4.3 mm. The continuous-current rating of F10028S106L060L is 5 A.
