The Basic Contact Probe F04011B040G080 (item number 1169648) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), F04011B040G080 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. The design combines a pitch of 1 mm / 40 mil with tip style 11 (Spherical) and a tip diameter of 0.4 mm. F04011B040G080 operates with 80 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F04011B040G080 is 2 A.
