Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F040 |
| Pitch (mm/mil) | 1,00 / 40 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 35.9 |
| Protrusion height (mm) | 7 |
| Tip style diameter (mm) | 0.4 |
| Barrel diameter (mm) | 0.62 |
| Materials and surfaces | |
|---|---|
| Tip style | 11 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 40 |
| Spring force (cN) | 80 |
| Nominal travel (mm) | 4.3 |
| Maximum travel (mm) | 6.4 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 2 |
| Typical contact resistance (mOhm) | 20 |
Graphics
Beschreibung des Produkts
The Basic Contact Probe F04011B040G080 (item number 1169648) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), F04011B040G080 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. The design combines a pitch of 1 mm / 40 mil with tip style 11 (Spherical) and a tip diameter of 0.4 mm. F04011B040G080 operates with 80 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F04011B040G080 is 2 A.