The Fine Pitch Double Plunger Probe FP510D0101B035G050L166 (item number 1001356) is designed for precise contacting where installation space is limited. Tip style 01 (Conical 90°) targets FP510D0101B035G050L166 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP510D0101B035G050L166, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP510D0101B035G050L166 includes pitch 0.7 mm / 28 mil, spring force 50 cN, continuous current 1 A.
