The Basic Contact Probe F77228B200G300 (item number 1001571) is a spring-loaded probe for temporary electrical contact with test points. With tip style 28 (4-point crown stepped), F77228B200G300 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F77228B200G300 combines a pitch of 2.54 mm / 100 mil with tip style 28 (4-point crown stepped) and a tip diameter of 2 mm. F77228B200G300 operates with 300 cN spring force and 4 mm nominal travel. F77228B200G300 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77228B200G300 is made of beryllium copper and is gold-plated.
