The Basic Contact Probe F07537B050G150 (item number 1006727) is a spring-loaded probe for temporary electrical contact with test points. With tip style 37 (4-point crown stepped), F07537B050G150 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F07537B050G150 combines a pitch of 1.9 mm / 75 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. For F07537B050G150, spring force is 150 cN at a nominal travel of 4.3 mm. F07537B050G150 is rated for 4 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F07537B050G150 is made of beryllium copper and is gold-plated.
