The Basic Contact Probe F77217B200G150 (item number 1006747) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F77217B200G150 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B200G150 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. For F77217B200G150, spring force is 150 cN at a nominal travel of 4 mm. The electrical rating of F77217B200G150 combines 5 A continuous current with 25 mΩ typical contact resistance. The plunger in F77217B200G150 is made of beryllium copper and is gold-plated.
