The Basic Contact Probe F10014B150G200 (item number 1011007) is a spring-loaded probe for temporary electrical contact with test points. With tip style 14 (4-point crown stepped (self-cleaning)), F10014B150G200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014B150G200 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.5 mm. For F10014B150G200, spring force is 200 cN at a nominal travel of 4.3 mm. The electrical rating of F10014B150G200 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10014B150G200 is made of beryllium copper and is gold-plated.
