The Basic Contact Probe F10017B200G200 (item number 1015133) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B200G200 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B200G200 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. F10017B200G200 operates with 200 cN spring force and 4.3 mm nominal travel. F10017B200G200 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10017B200G200 is made of beryllium copper and is gold-plated.
