The Basic Contact Probe F10006B150G100IK04 (item number 1017683) is a spring-loaded probe for temporary electrical contact with test points. With tip style 06 (Serrated stepped), F10006B150G100IK04 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F10006B150G100IK04 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 1.5 mm. F10006B150G100IK04 operates with 100 cN spring force and 4.3 mm nominal travel. The electrical rating of F10006B150G100IK04 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10006B150G100IK04 is made of beryllium copper and is gold-plated.