The Basic Contact Probe F03929S050M130 (item number 1020462) is designed for repeated contacting of test points in electronic test fixtures. With tip style 29 (4-point crown), F03929S050M130 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F03929S050M130 combines a pitch of 1 mm / 39 mil with tip style 29 (4-point crown) and a tip diameter of 0.5 mm. For F03929S050M130, spring force is 130 cN at a nominal travel of 2 mm. The continuous-current rating of F03929S050M130 is 2 A.
