The Fine Pitch Double Plunger Probe FP300D2901B015G030L057 (item number 1023005) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901B015G030L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901B015G030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP300D2901B015G030L057 includes pitch 0.4 mm / 16 mil, spring force 30 cN, continuous current 1.4 A.
