The Fine Pitch Double Plunger Probe FP210D2903B010G011L057 (item number 1024774) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP210D2903B010G011L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP210D2903B010G011L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 11 cN, continuous current 0.5 A.
