The Fine Pitch Double Plunger Probe FP210D0303B010G016L057 (item number 1031798) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP210D0303B010G016L057 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP210D0303B010G016L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 16 cN, continuous current 0.8 A.
