As a Basic Contact Probe, F10002B170G200 (item number 1043597) establishes a spring-loaded electrical connection to the test point. With tip style 02 (Conical 90° stepped), F10002B170G200 combines ICT/FCT use with a geometry intended for solder pads and vias. The design combines a pitch of 2.54 mm / 100 mil with tip style 02 (Conical 90° stepped) and a tip diameter of 1.7 mm. For F10002B170G200, spring force is 200 cN at a nominal travel of 4.3 mm. F10002B170G200 is rated for 5 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F10002B170G200 is made of beryllium copper and is gold-plated.
