The Fine Pitch Double Plunger Probe FP570D0301B030G030L057 (item number 1128177) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP570D0301B030G030L057 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP570D0301B030G030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP570D0301B030G030L057 includes pitch 0.8 mm / 31 mil, spring force 30 cN, continuous current 3.8 A.
