As a Basic Contact Probe, F10015B170G150 (item number 1140870) establishes a spring-loaded electrical connection to the test point. With tip style 15 (Triangular 45° stepped), F10015B170G150 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F10015B170G150 combines a pitch of 2.54 mm / 100 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 1.7 mm. F10015B170G150 operates with 150 cN spring force and 4.3 mm nominal travel. The electrical rating of F10015B170G150 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10015B170G150 is made of beryllium copper and is gold-plated.
