The Basic Contact Probe F10035S050L400 (item number 1167609) is designed for repeated contacting of test points in electronic test fixtures. With tip style 35 (3-point crown stepped (self-cleaning)), F10035S050L400 combines ICT/FCT use with a geometry intended for solder pads and vias. F10035S050L400 combines a pitch of 2.54 mm / 100 mil with tip style 35 (3-point crown stepped (self-cleaning)) and a tip diameter of 0.5 mm. For F10035S050L400, spring force is 400 cN at a nominal travel of 4.3 mm. The continuous-current rating of F10035S050L400 is 5 A.
