F10037S050L150 (item number 1167781) belongs to the Basic Contact Probe range for precise, repeatable contacting of electronic test points. With tip style 37 (4-point crown stepped), F10037S050L150 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10037S050L150 combines a pitch of 2.54 mm / 100 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. F10037S050L150 operates with 150 cN spring force and 4.3 mm nominal travel. For F10037S050L150, the specified continuous current is 5 A.
