The Basic Contact Probe F07514S100L150 (item number 1168147) is designed for repeated contacting of test points in electronic test fixtures. With tip style 14 (4-point crown stepped (self-cleaning)), F07514S100L150 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. The design combines a pitch of 1.9 mm / 75 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1 mm. F07514S100L150 operates with 150 cN spring force and 4.3 mm nominal travel. The continuous-current rating of F07514S100L150 is 4 A.
