The Basic Contact Probe F10063S120L200 (item number 1168328) is designed for repeated contacting of test points in electronic test fixtures. With tip style 63 (8-point crown stepped (self-cleaning)), F10063S120L200 combines ICT/FCT use with a geometry intended for wire-wrap posts, including contacts that are slightly bent or twisted. The design combines a pitch of 2.54 mm / 100 mil with tip style 63 (8-point crown stepped (self-cleaning)) and a tip diameter of 1.2 mm. For F10063S120L200, spring force is 200 cN at a nominal travel of 4.3 mm. F10063S120L200 is specified for 5 A continuous current.
