F58837S050L200 (item number 1169165) belongs to the Basic Contact Probe range for precise, repeatable contacting of electronic test points. With tip style 37 (4-point crown stepped), F58837S050L200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F58837S050L200 combines a pitch of 2.54 mm / 100 mil with tip style 37 (4-point crown stepped) and a tip diameter of 0.5 mm. For F58837S050L200, spring force is 200 cN at a nominal travel of 9.3 mm. F58837S050L200 is specified for 5 A continuous current.
